Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences) |
 enlarge | Authors: L. Reimer, H. Kohl
Publisher: Springer
Category: Book
List Price: $139.00
Buy New: $119.35
You Save: $19.65 (14%)
New (17) Used (8) from $108.30
Sales Rank: 340156
Media: Hardcover
Edition: 5th
Pages: 590
Number Of Items: 1
Shipping Weight (lbs): 7.4
Dimensions (in): 11.2 x 8.5 x 2.6
ISBN: 0387400931
Dewey Decimal Number: 620
EAN: 9780387400938
ASIN: 0387400931
Publication Date: August 28, 2008
Availability: Usually ships in 24 hours
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Product Description
Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again.
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